David Waechter, PhD

Retired Engineer/Scientist, now Writer

Characteristics of dual-gate thin-film transistors for applications in digital radiology


Journal article


David Waechter, Zhongshou Huang, Wei Zhao, Ira Blevis, J A Rowlands
Canadian Journal of Physics, vol. 74, 1996, pp. 131-134

Cite

Cite

APA   Click to copy
Waechter, D., Huang, Z., Zhao, W., Blevis, I., & Rowlands, J. A. (1996). Characteristics of dual-gate thin-film transistors for applications in digital radiology. Canadian Journal of Physics, 74, 131–134.


Chicago/Turabian   Click to copy
Waechter, David, Zhongshou Huang, Wei Zhao, Ira Blevis, and J A Rowlands. “Characteristics of Dual-Gate Thin-Film Transistors for Applications in Digital Radiology.” Canadian Journal of Physics 74 (1996): 131–134.


MLA   Click to copy
Waechter, David, et al. “Characteristics of Dual-Gate Thin-Film Transistors for Applications in Digital Radiology.” Canadian Journal of Physics, vol. 74, 1996, pp. 131–34.


BibTeX   Click to copy

@article{waechter1996a,
  title = {Characteristics of dual-gate thin-film transistors for applications in digital radiology},
  year = {1996},
  journal = {Canadian Journal of Physics},
  pages = {131-134},
  volume = {74},
  author = {Waechter, David and Huang, Zhongshou and Zhao, Wei and Blevis, Ira and Rowlands, J A}
}